IOP science 是英國皇家物理學(xué)會(huì)(IOP)的期刊平臺(tái)，包含了幾十種期刊，出版學(xué)科包括：應(yīng)用物理，計(jì)算機(jī)科學(xué)，凝聚態(tài)和材料科學(xué)，物理總論，高能和核能物理，數(shù)學(xué)和應(yīng)用數(shù)學(xué)，數(shù)學(xué)物理，測(cè)量科學(xué)和傳感器，醫(yī)學(xué)和生物學(xué)，光學(xué)，原子和分子物理，物理教育學(xué)，離子物理等。Surface Topography: Metrology and Properties（STMP）期刊的創(chuàng)辦，旨在促進(jìn)表面形貌計(jì)量學(xué)和性能出版了應(yīng)用功能表面的最新物理、化學(xué)、材料科學(xué)和工程研究。2021年，由我國學(xué)者為客座編輯設(shè)立主題特刊，面向中國計(jì)量測(cè)試領(lǐng)域的專家和學(xué)者征文。具體事項(xiàng)如下：
Surface Topography: Metrology and Properties
Microscopy for Surfaces
Guest Editors
Jian Liu Harbin Institute of Technology, China
Xumin Ding Harbin Institute of Technology, China
Scope
The effects of surface topography on properties occur across all length scales, from the macro, through the micro and even the nanoscale. In order to properly assess surfaces at smaller scales, microscopy is one of the most powerful family of techniques in the researcher’s arsenal. Optical, electron, probe and other microscope technologies can all be employed, as can supporting techniques that can be used to maximise microscopy’s effectiveness in characterising surfaces.
This special issue aims to highlight microscopy’s potential across disciplines and techniques. It will address the application of microscopy to engineered and to biological surfaces, in industry and in academia. Looking at current challenges, solutions and applications it will represent a significant resource for researchers in this area.
